Browsing by Author "jiang, Rong"
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Publication Gate bias and length dependences of total-ionizing-dose effects in InGaAs FinFETs on bulk Si
Proceedings paper2018-09, Radiation Effects on Components and Systems - RADECS, 16/09/2018Publication Low-frequency Noise and Defects in Copper and Ruthenium Resistors
Journal article2019, Applied Physics Letters, (114) 20, p.203501