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Browsing by Author "van Ingen Schenau, K."

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    248 nm lithography for the 0.18 μm generation

    Vandenberghe, Geert  
    ;
    Tzviatkov, Plamen
    ;
    Yen, Anthony
    ;
    Ronse, Kurt  
    ;
    Van den hove, Luc  
    Proceedings paper
    1996, Proceedings of the Microlithography Seminar INTERFACE'96, 27/10/1996, p.29-42
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    Process optimization for sub-100-nm gate patterns using phase edge lithography

    van Ingen Schenau, K.
    ;
    Vleeming, Bert
    ;
    Gehoel-van Ansem, W. F.
    ;
    Wong, P.
    ;
    Vandenberghe, Geert  
    Proceedings paper
    2001, Advances in Resist Technology and Processing XVIII, 26/02/2001, p.200-211
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    Status of ArF lithography for the 130nm technology node

    Ronse, Kurt  
    ;
    Vandenberghe, Geert  
    ;
    Jaenen, Patrick  
    ;
    Delvaux, Christie  
    Proceedings paper
    2000, Optical Microlithography XIII, 1/03/2000, p.410

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