Browsing by author "Vici, Andrea"
Now showing items 1-8 of 8
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A multi-energy level agnostic approach for defect generation during TDDB stress
Vici, Andrea; Degraeve, Robin; Kaczer, Ben; Franco, Jacopo; Van Beek, Simon; De Wolf, Ingrid (2022) -
A multi-energy level agnostic simulation approach to defect generation
Vici, Andrea; Degraeve, Robin; Kaczer, Ben; Franco, Jacopo; Van Beek, Simon; De Wolf, Ingrid (2021) -
Analysis of TDDB lifetime projection in low thermal budget HfO2/SiO2 stacks for sequential 3D integrations
Vici, Andrea; Degraeve, Robin; Roussel, Philippe; Franco, Jacopo; Kaczer, Ben; De Wolf, Ingrid (2023) -
Analytical Markov Model to Calculate TDDB at Any Voltage and Temperature Stress Condition
Vici, Andrea; Degraeve, Robin; Franco, Jacopo; Kaczer, Ben; Roussel, Philippe; De Wolf, Ingrid (2023) -
Combining SILC and BD statistics for low-voltage lifetime projection in HK/MG stacks
Vici, Andrea; Degraeve, Robin; Bastos, Joao; Roussel, Philippe; De Wolf, Ingrid (2022) -
Cyclic Thermal Effects on Devices of Two-Dimensional Layered Semiconducting Materials
Kim, Yeonsu; Kaczer, Ben; Verreck, Devin; Grill, Alexander; Kim, Doyoon; Song, Jaeick; Diaz Fortuny, Javier; Vici, Andrea; Park, Jongseon; Van Beek, Simon; Simicic, Marko; Bury, Erik; Vaisman Chasin, Adrian; Linten, Dimitri; Lee, Jaewoo; Chun, Jungu; Kim, Seongji; Seo, Beumgeun; Choi, Junhee; Shim, Joon Hyung; Lee, Kookjin; Kim, Gyu-Tae (2021) -
Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress
Lee, Kookjin; Kaczer, Ben; Kruv, Anastasiia; Gonzalez, Mario; Eneman, Geert; Okudur, Oguzhan Orkut; Grill, Alexander; Franco, Jacopo; Vici, Andrea; Degraeve, Robin; De Wolf, Ingrid (2022) -
Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology
Saraza Canflanca, Pablo; Diaz Fortuny, Javier; Vici, Andrea; Bury, Erik; Degraeve, Robin; Kaczer, Ben (2023)