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A multi-energy level agnostic approach for defect generation during TDDB stress
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Authors
Vici, Andrea
;
Degraeve, Robin
;
Kaczer, Ben
;
Franco, Jacopo
;
Van Beek, Simon
;
De Wolf, Ingrid
DOI
10.1016/j.sse.2022.108298
ISSN
0038-1101
Issue
Special issue: Papers from INFOS 2021
Journal
SOLID-STATE ELECTRONICS
Volume
193
Title
A multi-energy level agnostic approach for defect generation during TDDB stress
Publication type
Journal article
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3
20.500.12860/39898.3
*
2022-08-31T09:43:05Z
validation by library/open access desk
2
20.500.12860/39898.2
2022-06-24T13:08:32Z
validation by imec author
1
20.500.12860/39898
2022-05-27T02:22:57Z
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