Browsing by author "Van Beek, Simon"
Now showing items 1-20 of 49
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A multi-energy level agnostic approach for defect generation during TDDB stress
Vici, Andrea; Degraeve, Robin; Kaczer, Ben; Franco, Jacopo; Van Beek, Simon; De Wolf, Ingrid (2022) -
A multi-energy level agnostic simulation approach to defect generation
Vici, Andrea; Degraeve, Robin; Kaczer, Ben; Franco, Jacopo; Van Beek, Simon; De Wolf, Ingrid (2021) -
A Systematic Assessment of W-Doped CoFeB Single Free Layers for Low Power STT-MRAM Applications
Rao, Siddharth; Couet, Sebastien; Van Beek, Simon; Kundu, Shreya; Houshmand Sharifi, Shamin; Jossart, Nico; Kar, Gouri Sankar (2021) -
Array-based statistical characterization of CMOS degradation modes and modeling of the time-dependent variability induced by different stress patterns in the {VG,VD} bias space
Bury, Erik; Vaisman Chasin, Adrian; Chuang, Kent; Vandemaele, Michiel; Van Beek, Simon; Franco, Jacopo; Kaczer, Ben; Linten, Dimitri (2019) -
BEOL compatible high retention perpendicular SOT-RAM device for SRAM replacement and AiMC
Couet, Sebastien; Rao, Siddharth; Van Beek, Simon; Nguyen, Van Dai; Garello, Kevin; Jayakumar, Ganesh; Costa, Diogo; Cai, Kaiming; Yasin, Farrukh; Crotti, Davide; Kar, Gouri Sankar (2021) -
Cyclic Thermal Effects on Devices of Two-Dimensional Layered Semiconducting Materials
Kim, Yeonsu; Kaczer, Ben; Verreck, Devin; Grill, Alexander; Kim, Doyoon; Song, Jaeick; Diaz Fortuny, Javier; Vici, Andrea; Park, Jongseon; Van Beek, Simon; Simicic, Marko; Bury, Erik; Vaisman Chasin, Adrian; Linten, Dimitri; Lee, Jaewoo; Chun, Jungu; Kim, Seongji; Seo, Beumgeun; Choi, Junhee; Shim, Joon Hyung; Lee, Kookjin; Kim, Gyu-Tae (2021) -
Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications
Lee, Kookjin; Ji, Hyunjin; Kim, Yanghee; Kaczer, Ben; Lee, Hyebin; Ahn, Jae-Pyoung; Choi, Junhee; Grill, Alexander; Panarella, Luca; Smets, Quentin; Verreck, Devin; Van Beek, Simon; Vaisman Chasin, Adrian; Linten, Dimitri; Na, Junhong; Lee, Jae Woo; De Wolf, Ingrid; Kim, Gyu-Tae (2022) -
Distinctive behavior of perpendicular magnetic tunnel junctions with size comparable to the electrical switching nucleation
Kim, Woojin; Rao, Siddharth; Van Beek, Simon; Garello, Kevin; Couet, Sebastien; Swerts, Johan; Mertens, Sofie; Lin, Tsann; Souriau, Laurent; Kundu, Shreya; Tsvetanova, Diana; Donadio, Gabriele Luca; Yasin, Farrukh; Sakhare, Sushil; Furnemont, Arnaud; Kar, Gouri Sankar (2017) -
Double torque perpendicular STT-MRAM devices for low power IoT and edge computing
Rao, Siddharth; Carpenter, Robert; Couet, Sebastien; Van Beek, Simon; Perumkunnil, Manu; Jossart, Nico; O'Sullivan, Barry; Kundu, Shreya; Kim, Woojin; Garello, Kevin; Souriau, Laurent; Yasin, Farrukh; Houshmand Sharifi, Shamin; Crotti, Davide; Kar, Gouri Sankar (2021) -
Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution
Van Beek, Simon; Rao, Siddharth; Kundu, Shreya; Kim, Woojin; O'Sullivan, Barry J.; Cosemans, Stefan; Yasin, Farukh; Carpenter, Robert; Couet, Sebastien; Sharifi, Shamin H.; Jossart, Nico; Crotti, Davide; Kar, Gouri (2021) -
Electrical switching properties in asymmetric MTJs for logic applications
Raymenants, Eline; Manfrini, Mauricio; Vaysset, Adrien; Swerts, Johan; Van Beek, Simon; Heyns, Marc; Nikonov, D.E.; Sasikanth, M; Young, I.A.; Mocuta, Dan; Radu, Iuliana (2017) -
Experimental extraction of BEOL composite equivalent thermal conductivities for application in self-heating simulations
Bury, Erik; Kaczer, Ben; Van Beek, Simon; Linten, Dimitri (2018) -
Experimental observation of back-hopping with reference layer flipping by high-voltage pulse in perpendicular magnetic tunnel junctions
Kim, Woojin; Couet, Sebastien; Swerts, Johan; Lin, Tsann; Tomczak, Yoann; Souriau, Laurent; Tsvetanova, Diana; Sankaran, Kiroubanand; Donadio, Gabriele Luca; Crotti, Davide; Van Beek, Simon; Rao, Siddharth; Goux, Ludovic; Kar, Gouri Sankar; Furnemont, Arnaud (2016) -
Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown
O'Sullivan, Barry; Van Beek, Simon; Roussel, Philippe; Rao, Siddharth; Kim, Woojin; Couet, Sebastien; Swerts, Johan; Yasin, Farrukh; Crotti, Davide; Linten, Dimitri; Kar, Gouri Sankar (2018) -
First demonstration of field-free perpendicular SOT-MRAM for ultrafast and high-density embedded memories
Cai, Kaiming; Talmelli, Giacomo; Fan, Kaiquan; Van Beek, Simon; Kateel, Vaishnavi; Gupta, Mohit; Gama Monteiro Junior, Maxwel; Ben Chroud, Mohamed; Jayakumar, Ganesh; Trovato, Anna; Rao, Siddharth; Kar, Gouri Sankar; Couet, Sebastien (2022) -
Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions
Van Beek, Simon; Martens, Koen; Roussel, Philippe; Donadio, Gabriele Luca; Swerts, Johan; Mertens, Sofie; Kar, Gouri Sankar; Min, Tai; Groeseneken, Guido (2015) -
Impact of ambient temperature on the switching behavior of voltage-controlled perpendicular magnetic tunnel junction
Wu, Jackson; Kim, Woojin; Van Beek, Simon; Couet, Sebastien; Carpenter, Robert; Rao, Siddharth; Kundu, Shreya; Yasin, Farrukh; Van Houdt, Jan; Groeseneken, Guido; Crotti, Davide; Kar, Gouri Sankar (2020) -
Impact of ambient temperature on the switching of voltage-controlled perpendicular magnetic tunnel junction
Wu, Jackson; Kim, Woojin; Van Beek, Simon; Couet, Sebastien; Carpenter, Robert; Rao, Siddharth; Kundu, Shreya; Van Houdt, Jan; Groeseneken, Guido; Crotti, Davide; Kar, Gouri Sankar (2021) -
Impact of operating temperature on the electrical and magnetic properties of the bottom-pinned perpendicular magnetic tunnel junctions
Wu, Jackson; Kim, Woojin; Rao, Siddharth; Garello, Kevin; Van Beek, Simon; Couet, Sebastien; Liu, Enlong; Swerts, Johan; Kundu, Shreya; Souriau, Laurent; Yasin, Farrukh; Crotti, Davide; Jochum, Johanna; Van Bael, Margriet; Van Houdt, Jan; Groeseneken, Guido; Kar, Gouri Sankar (2018-10) -
Impact of processing and stack optimization on the reliability of perpendicular STT-MRAM
Van Beek, Simon; Martens, Koen; Roussel, Philippe; Couet, Sebastien; Souriau, Laurent; Swerts, Johan; Kim, Woojin; Rao, Siddharth; Mertens, Sofie; Lin, Tsann; Crotti, Davide; Degraeve, Robin; Bury, Erik; Linten, Dimitri; Kar, Gouri Sankar; Groeseneken, Guido (2017)