Authors

Van Beek, Simon; Martens, Koen; Roussel, Philippe; Donadio, Gabriele Luca; Swerts, Johan; Mertens, Sofie; Kar, Gouri Sankar; Min, Tai; Groeseneken, Guido

Conference

IEEE International Reliability Physics Symposisum - IRPS

Title

Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions

Publication type

Proceedings paper

Embargo date

9999-12-31