Browsing by author "Gramenova, Emilia"
Now showing items 1-4 of 4
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Impact of processing parameters on leakage current and defect behavior of n+p silicon junction diodes
Gramenova, Emilia; Jansen, Philippe; Simoen, Eddy; Vanhellemont, Jan; Dupas, Luc; Deferm, Ludo (1997) -
Impact of processing parameters on leakage current and defect behavior of n+p silicon junction diodes
Gramenova, Emilia; Jansen, Philippe; Simoen, Eddy; Vanhellemont, Jan; Dupas, Luc; Deferm, Ludo (1999) -
Non-destructive techniques for identification and control of processing induced extended defects in silicon and correlation with device yield
Vanhellemont, Jan; Servidori, M.; Higgs, V.; Gramenova, Emilia; Simoen, Eddy; Jansen, Philippe (1996) -
Non-destructive techniques for identification and control of processing induced extended defects in silicon and correlation with device yield
Vanhellemont, Jan; Milita, S.; Servidori, M.; Higgs, V.; Kissinger, G.; Gramenova, Emilia; Simoen, Eddy; Jansen, Philippe (1997)