Now showing items 1-5 of 5

    • Gatestacks for scalable high-performance FinFETs 

      Vellianitis, Georgios; Van Dal, Mark; Witters, Liesbeth; Curatola, Gilberto; Doornbos, Gerben; Collaert, Nadine; Jonville, C.; Torregiani, Cristina; Lai, Li-Shyue; Petry, Jasmine; Pawlak, Bartek; Duffy, Ray; Demand, Marc; Beckx, Stephan; Mertens, Sofie; Delabie, Annelies; Vandeweyer, Tom; Delvaux, Christie; Leys, Frederik; Hikavyy, Andriy; Rooyackers, Rita; Kaiser, M.; Weemaes, R.G.R.; Voogt, F.; Roberts, H.; Donnet, D.; Biesemans, Serge; Jurczak, Gosia; Lander, Rob (2007)
    • Material aspects and challenges for SOI FinFET integration 

      Van Dal, Mark; Vellianitis, Georgios; Duffy, Ray; Doornbos, Gerben; Pawlak, Bartek; Duriez, Blandine; Lai, Li-Shyue; Hikavyy, Andriy; Vandeweyer, Tom; Demand, Marc; Altamirano Sanchez, Efrain; Rooyackers, Rita; Witters, Liesbeth; Collaert, Nadine; Jurczak, Gosia; Kaiser, M.; Weemaes, R. G. R.; Lander, Rob (2008)
    • Material aspects and challenges for SOI FinFET integration 

      Van Dal, Mark; Vellianitis, Georgios; Duffy, Ray; Pawlak, Bartek; Lai, Li-Shyue; Hikavyy, Andriy; Collaert, Nadine; Jurczak, Gosia; Lander, Rob (2008)
    • Multi-gate devices for the 32nm technology node and beyond 

      Collaert, Nadine; De Keersgieter, An; Dixit, Abhisek; Ferain, Isabelle; Lai, Li-Shyue; Lenoble, Damien; Mercha, Abdelkarim; Nackaerts, Axel; Pawlak, Bartek; Rooyackers, Rita; Schulz, Thomas; San, Kemal Tamer; Son, Nak Jin; Van Dal, Mark; Verheyen, Peter; von Arnim, Klaus; Witters, Liesbeth; De Meyer, Kristin; Biesemans, Serge; Jurczak, Gosia (2007)
    • Multi-gate devices for the 32nm technology node and beyond 

      Collaert, Nadine; De Keersgieter, An; Dixit, Abhisek; Ferain, Isabelle; Lai, Li-Shyue; Lenoble, Damien; Mercha, Abdelkarim; Nackaerts, Axel; Pawlak, Bartek; Rooyackers, Rita; Schulz, Thomas; San, Kemal Tamer; Son, Nak Jin; Van Dal, Mark; Verheyen, Peter; von Arnim, Klaus; Witters, Liesbeth; De Meyer, Kristin; Biesemans, Serge; Jurczak, Gosia (2008)