Browsing by author "Ranjan, R."
Now showing items 1-3 of 3
-
A comprehensive model for breakdown mechanism in HfO2 high-k gate stacks
Ranjan, R.; Pey, K.L.; Tung, C.H.; Tang, L.J.; Groeseneken, Guido; Bera, L.K.; De Gendt, Stefan (2004) -
A new breakdown failure mechanism in HfO2 gate dielectrics
Ranjan, R.; Pey, K.L.; Tang, L.J.; Tung, C.H.; Groeseneken, Guido; Radhakrishnan, M.K.; Kaczer, Ben; Degraeve, Robin; De Gendt, Stefan (2004) -
Breakdown induced thermo-chemical reactions in HfO2 high-k/poly-silicon gate stacks
Ranjan, R.; Pey, K.L.; Tung, C.H.; Tang, L.J.; Ang, D.S.; Groeseneken, Guido; De Gendt, Stefan; Bera, L.K. (2005)