Browsing by author "Nauwelaerts, Sophie"
Now showing items 1-4 of 4
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Advanced characterization of high-K materials: a nuclear approach
Brijs, Bert; Huyghebaert, Cedric; Nauwelaerts, Sophie; Caymax, Matty; Vandervorst, Wilfried; Nakajima, K.; Kimura, K.; Bergmaier, A.; Dollinger, G.; Lennard, W. N.; Terwagne, G.; Vantomme, Andre (2002) -
Advanced RBS analysis of thin films in micro-electronics
Brijs, Bert; Deleu, Jeroen; Huygebaert, C.; Nauwelaerts, Sophie; Vandervorst, Wilfried; Kimura, K. (2000) -
Advanced RBS analysis of thin films in micro-electronics
Brijs, Bert; Deleu, Jeroen; Huyghebaert, Cedric; Nauwelaerts, Sophie; Nakajima, K.; Kimura, K.; Vandervorst, Wilfried (2001) -
Quantification and depth profiling of a ZrO2 (2nm)/A1203 (1nm) layer with NRA, RBS, HRBS, HERD
Brijs, Bert; Huyghebaert, Cedric; Nauwelaerts, Sophie; Caymax, Matty; Vandervorst, Wilfried; Nakajima, K.; Kimura, K.; Bergmaier, A.; Dollinger, G.; Lennard, W. N.; Terwagne, G.; Vantomme, Andre (2001)