Browsing by author "Blondeel, A."
Now showing items 1-11 of 11
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A BEEM study of PtSi Schottky contacts on ion-milled Si
Ru, Guo-Ping; Detavernier, C.; Alves Donaton, Ricardo; Blondeel, A.; Clauws, P.; Van Meirhaeghe, R. L.; Cardon, F.; Maex, Karen; Qu, X. P.; Zhu, S. Y.; Li, Bing-Zong (1999) -
Deep levels in high-energy proton-irradiated tin-doped n-type Czochralskii silicon
Simoen, Eddy; Claeys, Cor; Neimash, V. B.; Kraitchinskii, A.; Kras'ko, N.; Puzenko, O.; Blondeel, A.; Clauws, P. (2000) -
Defect analysis of n-type silicon strained layers
Simoen, Eddy; Loo, Roger; Roussel, Philippe; Caymax, Matty; Bender, Hugo; Claeys, C.; Herzog, H. J.; Blondeel, A.; Clauws, P. (2000) -
Defect analysis of n-type silicon strained layers
Simoen, Eddy; Loo, Roger; Roussel, Philippe; Caymax, Matty; Bender, Hugo; Claeys, Cor; Herzog, H. J.; Blondeel, A.; Clauws, P. (2001) -
Identification of Sn-V related acceptor levels in irradiated tin-doped n-type silicon
Simoen, Eddy; Claeys, Cor; Neimash, V. B.; Kraitchinskii, A.; Kras'ko, M.; Puzenko, O.; Blondeel, A.; Clauws, P.; Pattyn, Hugo; Koops, G.E.J.; Pattyn, H. (2000) -
On the electrical activity of oxygen-related extended defects in silicon
Vanhellemont, Jan; Simoen, Eddy; Bosman, Gijs; Claeys, Cor; Kaniava, Arvydas; Gaubas, Eugenijus; Blondeel, A.; Clauws, P. (1994) -
Spectroscopic study of oxygen related lattice defects in annealed silicon
Vanhellemont, Jan; Libezny, Milan; Simoen, Eddy; Claeys, Cor; Clauws, P.; Blondeel, A. (1994) -
Spectroscopic study of oxygen related lattice defects in annealed silicon
Vanhellemont, Jan; Libezny, Milan; Simoen, Eddy; Claeys, C.; Clauws, P.; Blondeel, A. (1995) -
Tin doping effects in silicon
Simoen, Eddy; Claeys, Cor; Neimash, V. B.; Kraitchinskii, A.; Kras'ko, M.; Puzenko, O.; Blondeel, A.; Clauws, P. (2000) -
Tin doping of silicon for controlling oxygen precipitation and radiation hardness
Claeys, Cor; Simoen, Eddy; Neimash, V. B.; Kraitchinskii, A.; Krask'o, M.; Puzenko, O.; Blondeel, A.; Clauws, P. (2001) -
Tin-related deep levels in proton-irradiated n-type silicon
Simoen, Eddy; Claeys, Cor; Neimash, V. B.; Kraitchinskii, A.; Kras'ko, M.; Puzenko, O.; Blondeel, A.; Clauws, P.; Koops, G.E.J.; Pattyn, H. (2000)