Browsing by author "Vassilev, Vesselin"
Now showing items 21-31 of 31
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Impact of CMOS Scaling and Technology Options on ESD Reliability
Mahadeva Iyer, Natarajan; Thijs, Steven; Vassilev, Vesselin; Tremouilles, David; Linten, Dimitri; Groeseneken, Guido (2005) -
Impact of elevated source drain architecture on ESD protection devices for a 90 nm CMOS technology node
Thijs, Steven; De Heyn, Vincent; Vassilev, Vesselin; Mahadeva Iyer, Natarajan; Linten, Dimitri; Jeamsaksiri, Wutthinan; Daenen, T.; Jurczak, Gosia; Rooyackers, Rita; Groeseneken, Guido (2003-09) -
Modeling and extraction of RF-performance parameters of CMOS electrostatic discharge protection devices
Vassilev, Vesselin; Groeseneken, Guido; Jenei, Snezana; Venegas, Rafael; Steyaert, M.; Maes, Herman (2002) -
Modeling and simulation for ESD protection circuit design and optimization
Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Thijs, Steven; Groeseneken, Guido (2004-12) -
Multilevel transmission line pulse (MTLP) tester
Daenen, Tom; Thijs, Steven; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; De Heyn, Vincent; Groeseneken, Guido (2004) -
RF ESD protection strategies - the design and performance trade-off challenges
Jansen, Philippe; Thijs, Steven; Linten, Dimitri; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Liu, Mingxu; Concannon, A.; Tremouilles, David; Nakaie, T.; Sawada, M.; Vashchenko, V.; ter Beek, M.; Hasebe, T.; Decoutere, Stefaan; Groeseneken, Guido (2005-09) -
Significance of the failure criterion on transmission line pulse testing
Keppens, Bart; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Groeseneken, Guido (2002) -
Snapback circuit model for cascaded NMOS ESD over-voltage protection structures
Vassilev, Vesselin; Lorenzini, Martino; Jansen, Philippe; Vashchenko, V.; Yang, J.J.; Concannon, A.; Archer, D.; Groeseneken, Guido; Mahadeva Iyer, Natarajan; Terbeek, M.; Thijs, Steven; Choi, B.J.; Steyaert, M.; Maes, Herman (2003-09) -
Thin L-shaped spacers for CMOS devices
Augendre, Emmanuel; Rooyackers, Rita; de Potter de ten Broeck, Muriel; Kunnen, Eddy; Beckx, Stephan; Mannaert, Geert; Vrancken, Christa; Vassilev, Vesselin; Chiarella, Thomas; Jurczak, Gosia; Debusschere, Ingrid (2003-09) -
Transient voltage overshoot in TLP testing - real or artifact
Tremouilles, David; Thijs, Steven; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Roussel, Philippe; Groeseneken, Guido (2005) -
Transient voltage overshoot in TLP testing - Real or artifact?
Tremouilles, David; Thijs, Steven; Roussel, Philippe; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Groeseneken, Guido (2007)