Browsing by author "Cartier, Ed"
Now showing items 1-3 of 3
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Characterization of charge trapping in SiO2/HfO2 dielectrics
Degraeve, Robin; Kerber, Andreas; Cartier, Ed; Pantisano, Luigi; Groeseneken, Guido (2003) -
Effect of bulk trap density on HfO2 reliability and yield
Degraeve, Robin; Kerber, Andreas; Roussel, Philippe; Cartier, Ed; Kauerauf, Thomas; Pantisano, Luigi; Groeseneken, Guido (2003-12) -
Impact of band structure on charge trapping in thin SiO2/Al2O3/poly-Si gate stacks
Pantisano, Luigi; Lucci, L.; Cartier, Ed; Kerber, Andreas; Groeseneken, Guido; Green, M.; Selmi, L. (2004-05)