Browsing by author "Wellekens, Dirk"
Now showing items 61-80 of 94
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Low voltage low cost nitride embedded flash memory cell
Xue, Gang; Van Houdt, Jan; Wellekens, Dirk; Haspeslagh, Luc; Hendrickx, Paul; De Vos, Joeri; Maes, Herman (2003) -
Method for endurance optimization of the HIMOStm flash memory cell in a 90nm CMOS technology
Yao, T.; Lowe, A.; Vermeulen, T.; Bellafiore, N.; Van Houdt, Jan; Wellekens, Dirk (2005) -
Multi-level charge storage in source-side injection Flash EEPROM
Montanari, Donato; Van Houdt, Jan; Wellekens, Dirk; Vanhorebeek, Guido; Haspeslagh, Luc; Deferm, Ludo; Groeseneken, Guido; Maes, Herman (1996) -
Novel small-area read-out circuit for multi-level memories
Montanari, Donato; Van Houdt, Jan; Wellekens, Dirk; Groeseneken, Guido; Maes, Herman (1997) -
Optimization of Al2O3 interpoly dielectric for embedded flash memory applications
Wellekens, Dirk; De Vos, Joeri; Van Houdt, Jan; van der Zanden, Koen (2008) -
Performance and reliability of 0.35μm/0.25μm HIMOS® technology for embedded flash memory applications
Wellekens, Dirk; Van Houdt, Jan; Verheyen, Peter; Frisson, Jo; Lorenzini, Martino; Xue, Gang; Maes, Herman (1999) -
Performance and reliability of HfALOx-based interpoly dielectrics for floating-gate flash memory
Govoreanu, Bogdan; Wellekens, Dirk; Haspeslagh, Luc; Brunco, David; De Vos, Joeri; Ruiz Aguado, Daniel; Blomme, Pieter; van der Zanden, Koen; Van Houdt, Jan (2008) -
Physical charge transport models for anomalous leakage current in floating gate-based nonvolatile memory cells
Schuler, Franz; Degraeve, Robin; Hendrickx, Paul; Wellekens, Dirk (2002) -
Physical description of anomalous charge loss in floating gate based NVM and identification of its dominant parameter
Schuler, Franz; Degraeve, Robin; Hendrickx, Paul; Wellekens, Dirk (2002) -
Radiation and Reliability Aspects of Electrically Erasable Floating Gate Memory Devices
Wellekens, Dirk (1995-05) -
Read-disturb and endurance of SSI-flash E2PROM devices at high operating temperatures
De Blauwe, Jan; Wellekens, Dirk; Groeseneken, Guido; Haspeslagh, Luc; Van Houdt, Jan; Deferm, Ludo; Maes, Herman (1998) -
Reliability investigation of a source side injection local charge trapping device
Breuil, Laurent; Haspeslagh, Luc; Blomme, Pieter; Lorenzini, Martino; Wellekens, Dirk; De Vos, Joeri; Van Houdt, Jan (2004) -
Reliable 5.9nm tunnel oxide flash EEPROM device
De Blauwe, Jan; Van Houdt, Jan; Wellekens, Dirk; Haspeslagh, Luc; Groeseneken, Guido; Maes, Herman (1997) -
Scaling of floating gate electrode for sub-40nm flash technologies
De Vos, Joeri; Wellekens, Dirk; Debusschere, Ingrid; Van Houdt, Jan; Van Aerde, Steven; Fischer, Pamela; Zagwijn, Peter (2008) -
SILC-related effects in flash E2PROM's - Part I: A quantitative model for steady-state SILC
De Blauwe, Jan; Van Houdt, Jan; Wellekens, Dirk; Groeseneken, Guido; Maes, Herman (1998) -
SILC-related effects in flash E2PROM's - Part II: Prediction of steady-state SILC-related disturb characteristics
De Blauwe, Jan; Van Houdt, Jan; Wellekens, Dirk; Groeseneken, Guido; Maes, Herman (1998) -
Source-side injection modeling by means of the Spherical-Harmonics Expansion of the Boltzmann transport equation
Lorenzini, Martino; Wellekens, Dirk; Haspeslagh, Luc; Van Houdt, Jan (2004-09) -
Stability of Schottky Barrier Diode Integrated in p-GaN Enhancement-mode GaN Power Technology
Gallardo, Jethro Oroceo; De Jaeger, Brice; Dash, Sachidananda; Tang, Shun-Wei; Tran, Thanh Nga; Wellekens, Dirk; Bakeroot, Benoit; Decoutere, Stefaan; Wu, Tian-Li (2021) -
Statistical analysis of the impact of anode recess on the electrical characteristics of AlGaN/GaN Schottky diodes with gated edge termination
Hu, Jie; Stoffels, Steve; Lenci, Silvia; De Jaeger, Brice; Ronchi, Nicolo; Tallarico, Andrea; Wellekens, Dirk; You, Shuzhen; Bakeroot, Benoit; Groeseneken, Guido; Decoutere, Stefaan (2016) -
Statistical model for SILC and pre-breakdown current jumps in ultra-thin oxide layers
Degraeve, Robin; Kaczer, Ben; Schuler, Franz; Lorenzini, Martino; Wellekens, Dirk; Hendrickx, Paul; Van Houdt, Jan; Haspeslagh, Luc; Tempel, Georg; Groeseneken, Guido (2001)