Browsing by author "Wellekens, Dirk"
Now showing items 41-60 of 94
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Feasibility analysis of direct tunneling through medium-k dielectrics for embedded RAM applications
Govoreanu, Bogdan; Degraeve, Robin; Kauerauf, Thomas; Magnus, Wim; Wellekens, Dirk; Groeseneken, Guido; Van Houdt, Jan (2005) -
Field and cycling dependence of anomalous charge loss in flash memory cells
Wellekens, Dirk; Hendrickx, Paul; Schuler, Franz; Van Houdt, Jan (2001) -
GaN Device architectures enabled by next generation substrates
Stoffels, Steve; Geens, Karen; Posthuma, Niels; Zhao, Ming; Liang, Hu; Li, Xiangdong; Wellekens, Dirk; You, Shuzhen; Bakeroot, Benoit; Van Hove, Marleen; Decoutere, Stefaan (2018) -
GaN-on-SOI: Monolithically integrated all GaN ICs for power conversion
Li, Xiangdong; Amirifar, Nooshin; Geens, Karen; Zhao, Ming; Guo, Weiming; Liang, Hu; You, Shuzhen; Posthuma, Niels; De Jaeger, Brice; Stoffels, Steve; Bakeroot, Benoit; Wellekens, Dirk; Vanhove, Benjamin; Cosnier, Thibault; Langer, Robert; Marcon, Denis; Groeseneken, Guido; Decoutere, Stefaan (2019) -
Growth and implementation of carbon-doped AlGaN layers for enhancement-mode HEMTs on 200 mm Si substrates
Su, Jie; Posthuma, Niels; Wellekens, Dirk; Saripalli, Yoga; Decoutere, Stefaan; Arif, Ronald; Papasouliotis, George (2016) -
Growth and implementation of carbon-doped AlGaN layers for enhancement-mode HEMTs on 200 mm Si substrates
Su, Jie; Posthuma, Niels; Wellekens, Dirk; Saripalli, Yoga; Decoutere, Stefaan; Arif, Ronald; Papasouliotis, George (2016) -
High temperature behaviour of GaN-on-Si high power MISHEMT devices
Wellekens, Dirk; Venegas, Rafael; Kang, Xuanwu; Zahid, Mohammed; Wu, Tian-Li; Marcon, Denis; Srivastava, Puneet; Van Hove, Marleen; Decoutere, Stefaan (2012) -
High Threshold Voltage Enhancement-Mode Regrown p-GaN Gate HEMTs With a Robust Forward Time-Dependent Gate Breakdown Stability
Tang, Shun-Wei; Huang, Zhen-Hong; Chen, Szu-Chia; Lin, Wei-Syuan; de Jaeger, Brice; Wellekens, Dirk; Borga, Matteo; Bakeroot, Benoit; Decoutere, Stefaan; Wu, Tian-Li (2022) -
High-temperature reliability behavior of SSI-flash EEPROM devices
De Blauwe, Jan; Wellekens, Dirk; Groeseneken, Guido; Haspeslagh, Luc; Van Houdt, Jan; Deferm, Ludo; Maes, Herman (1997) -
Hybrid floating gate cell for sub-20-nm NAND flash memory technology
Blomme, Pieter; Cacciato, Antonio; Wellekens, Dirk; Breuil, Laurent; Rosmeulen, Maarten; Kar, Gouri Sankar; Locorotondo, Sabrina; Vrancken, Christa; Richard, Olivier; Debusschere, Ingrid; Van Houdt, Jan (2012) -
Impact of crystal orientation on ohmic contact resistance of enhancement-mode pGaN gate high electron mobility transistors on 200 mm Si substrates
Van Hove, Marleen; Posthuma, Niels; Geens, Karen; Wellekens, Dirk; Li, Xiangdong; Decoutere, Stefaan (2018) -
Impact of crystal orientation on ohmic contact resistance of enhancement-mode pGaN gate high electron mobility transistors on 200 mm Si substrates
Van Hove, Marleen; Posthuma, Niels; Geens, Karen; Wellekens, Dirk; Decoutere, Stefaan (2017-09) -
Impact of Mg out-diffusion and activation on the p-GaN gate HEMT device performance
Posthuma, Niels; You, Shuzhen; Liang, Hu; Ronchi, Nicolo; Kang, Xuanwu; Wellekens, Dirk; Saripalli, Yoga; Decoutere, Stefaan (2016) -
Impact of top-surface tunnel-oxide nitridation on flash memory performance and reliability
Ganguly, Udayan; Guarini, Theresa; Wellekens, Dirk; Date, Lucien; Cho, Yonah; Rothschild, Aude; Swenberg, Johanes (2010) -
Impact of tunnel-oxide nitridation on endurance and read-disturb characteristics of flash E2PROM devices
De Blauwe, Jan; Wellekens, Dirk; Van Houdt, Jan; Degraeve, Robin; Haspeslagh, Luc; Groeseneken, Guido; Maes, Herman (1997) -
Integration of 650 V GaN power ICs on 200 mm engineered substrates
Li, Xiangdong; Geens, Karen; Wellekens, Dirk; Zhao, Ming; Magnani, Alessandro; Amirifar, Nooshin; Bakeroot, Benoit; You, Shuzhen; Fahle, Dirk; Hahn, Herwig; Heuken, Michael; Odnoblyudov, Vlad; Aktas, Ozgur; Basceri, Cem; Marcon, Denis; Groeseneken, Guido; Decoutere, Stefaan (2020) -
Integration of GaN power ICs on 200 mm engineered substrates
Li, Xiangdong; Geens, Karen; Wellekens, Dirk; Zhao, Ming; Magnani, Alessandro; Amirifar, Nooshin; Bakeroot, Benoit; You, Shuzhen; Fahle, Dirk; Hahn, Herwig; Odnoblyudov, Vlad; Aktas, Ozgur; Basceri, Cem; Marcon, Denis; Groeseneken, Guido; Decoutere, Stefaan (2020) -
Investigation and suppression of the gate disturb effect in source side injection flash EEPROM arrays
Van Houdt, Jan; Wellekens, Dirk; Vanhorebeek, Guido; Haspeslagh, Luc; Deferm, Ludo; Groeseneken, Guido; Maes, Herman (1995) -
Investigation of aggressively scaled HfALOx-based interpoly dielectric stacks for sub-45nm nonvolatile memory technologies
Govoreanu, Bogdan; Wellekens, Dirk; Haspeslagh, Luc; Brunco, David; De Vos, Joeri; Ruiz Aguado, Daniel; Blomme, Pieter; van der Zanden, Koen; Van Houdt, Jan (2007) -
Investigation of the soft-write mechanism in source-side injection flash EEPROM devices
Van Houdt, Jan; Wellekens, Dirk; Groeseneken, Guido; Maes, Herman (1995)