Browsing by author "Wellekens, Dirk"
Now showing items 81-94 of 94
-
Stress engineered AlN/AlGaN superlattices as high-voltage current blocking layers on 200 mm Silicon
Su, Jie; Liang, Hu; Posthuma, Niels; Wellekens, Dirk; Decoutere, Stefaan; Lee, Soo Min; Paranjpe, Ajit (2017) -
Study of secondary electron injection phenomena in deep sub-micron MOSFETs and flash cells
Xue, Gang; Van Houdt, Jan; Wellekens, Dirk; Haspeslagh, Luc; Lorenzini, Martino; Keppens, Bart; Maes, Herman (2000) -
Subthreshold source-side injection (S3I): a promising programming mechanism for scaled-down, low-power Flash memories
Van Houdt, Jan; De Blauwe, Jan; Wellekens, Dirk; Haspeslagh, Luc; Deferm, Ludo; Groeseneken, Guido; Maes, Herman (1996) -
The Flash Memory for the nodes to come: material issues from a device perspective
Govoreanu, Bogdan; Kittl, Jorge; De Vos, Joeri; Rothschild, Aude; Blomme, Pieter; Wellekens, Dirk; Ruiz Aguado, Daniel; Jurczak, Gosia; Van Houdt, Jan (2009) -
The future of flash memory: is floating gate technology doomed to lose the race?
Wellekens, Dirk; Van Houdt, Jan (2008) -
The HIMOS flash technology: the alternative solution for low-cost embedded memory
Van Houdt, Jan; Wellekens, Dirk; Haspeslagh, Luc (2003-04) -
Time dependent anomalous charge loss modeling in flash memories and an accelerated testing procedure
Schuler, Franz; Tempel, Georg; Melzner, H.; Hendrickx, Paul; Wellekens, Dirk; Lorenzini, Martino; Van Houdt, Jan (2001) -
Trading off between threshold voltage and subthreshold slope in AlGaN/GaN HEMTs with a p-GaN gate
Bakeroot, Benoit; Stoffels, Steve; Posthuma, Niels; Wellekens, Dirk; Decoutere, Stefaan (2019) -
Using Gate Leakage Conduction to Understand Positive Gate Bias Induced Threshold Voltage Shift in p-GaN Gate HEMTs
Tang, Shun-Wei; Bakeroot, Benoit; Huang, Zhen-Hong; Chen, Szu-Chia; Lin, Wei-Syuan; Lo, Ting-Chun; Borga, Matteo; Wellekens, Dirk; Posthuma, Niels; Decoutere, Stefaan; Wu, Tian-Li (2023-02) -
Voltage variant source side injection for multilevel storage in flash EEPROM
Montanari, Donato; Van Houdt, Jan; Wellekens, Dirk; Vanhorebeek, Guido; Haspeslagh, Luc; Deferm, Ludo; Groeseneken, Guido; Maes, Herman (1997) -
Water-assisted positive ion contamination resulting in charge loss in nonvolatile memories
Gassot, P.; Iline, A.; de Backer, E.; Tack, Marnix; Wellekens, Dirk; Van Houdt, Jan; Haspeslagh, Luc (2000) -
Write/erase degradation and disturb effects in source-side injection Flash EEPROM devices
Wellekens, Dirk; Van Houdt, Jan; Faraone, Lorenzo; Groeseneken, Guido; Maes, Herman (1994) -
Write/erase degradation and disturb effects in source-side injection flash EEPROM devices
Wellekens, Dirk; Van Houdt, Jan; Groeseneken, Guido; Maes, Herman; Faraone, Lorenzo (1995) -
Write/erase degradation in source side injection flash EEPROMs: characterization techniques and wearout mechanisms
Wellekens, Dirk; Van Houdt, Jan; Faraone, Lorenzo; Groeseneken, Guido; Maes, Herman (1995)