Authors

Wellekens, Dirk; Van Houdt, Jan; Faraone, Lorenzo; Groeseneken, Guido; Maes, Herman

Conference

Proceedings of the 5th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF

Title

Write/erase degradation and disturb effects in source-side injection Flash EEPROM devices

Publication type

Proceedings paper

Embargo date

9999-12-31