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Write/erase degradation and disturb effects in source-side injection Flash EEPROM devices
Publication:
Write/erase degradation and disturb effects in source-side injection Flash EEPROM devices
Date
1994
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wellekens, Dirk
;
Van Houdt, Jan
;
Faraone, Lorenzo
;
Groeseneken, Guido
;
Maes, Herman
Journal
Abstract
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1991
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1991
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations