Write/erase degradation and disturb effects in source-side injection Flash EEPROM devices

dc.contributor.author	Wellekens, Dirk
dc.contributor.author	Van Houdt, Jan
dc.contributor.author	Faraone, Lorenzo
dc.contributor.author	Groeseneken, Guido
dc.contributor.author	Maes, Herman
dc.contributor.imecauthor	Wellekens, Dirk
dc.contributor.imecauthor	Van Houdt, Jan
dc.contributor.imecauthor	Groeseneken, Guido
dc.contributor.orcidimec	Van Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned	2021-09-29T12:53:26Z
dc.date.available	2021-09-29T12:53:26Z
dc.date.embargo	9999-12-31
dc.date.issued	1994
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/461
dc.source.beginpage	147
dc.source.conference	Proceedings of the 5th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF
dc.source.conferencedate	4/10/1994
dc.source.conferencelocation	Glasgow UK
dc.source.endpage	153
dc.title	Write/erase degradation and disturb effects in source-side injection Flash EEPROM devices
dc.type	Proceedings paper
dspace.entity.type	Publication
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