Browsing by author "Van Houdt, Jan"
Now showing items 201-220 of 358
-
Junctionless array with ultrathin poly\TiN floating gate and HfAlO based intergate dielectric for sub-15nm planar NAND Flash
Blomme, Pieter; Versluijs, Janko; Ercken, Monique; Souriau, Laurent; Hody, Hubert; Vecchio, Emma; Paraschiv, Vasile; Tan, Chi Lim; Van den Bosch, Geert; Van Houdt, Jan (2016-05) -
Kinetic defect distribution approach for modeling the transient, endurance and retention of a-VMCO RRAM
Subhechha, Subhali; Degraeve, Robin; Roussel, Philippe; Goux, Ludovic; Clima, Sergiu; De Meyer, Kristin; Van Houdt, Jan; Kar, Gouri Sankar (2017) -
Lanthanide aluminates as dielectrics for non-volatile memory applications: material aspects
Adelmann, Christoph; Swerts, Johan; Richard, Olivier; Conard, Thierry; Popovici, Mihaela Ioana; Meersschaut, Johan; Afanasiev, Valeri; Breuil, Laurent; Cacciato, Antonio; Opsomer, Karl; Brijs, Bert; Tielens, Hilde; Pourtois, Geoffrey; Bender, Hugo; Jurczak, Gosia; Van Houdt, Jan; Van Elshocht, Sven; Kittl, Jorge (2011) -
Laser thermal anneal of polysilicon channel to boost 3D memory performance
Lisoni, Judit; Arreghini, Antonio; Congedo, Gabriele; Toledano Luque, Maria; Toqué-Trésonne, Inès; Huet, Karim; Capogreco, Elena; Liu, Lifang; Tan, Chi Lim; Degraeve, Robin; Van den Bosch, Geert; Van Houdt, Jan (2014) -
Lateral distribution of electrons trapped in nitride layers
Lorenzini, Martino; Rosmeulen, Maarten; Breuil, Laurent; Haspeslagh, Luc; Van Houdt, Jan; De Meyer, Kristin (2005) -
Linking EUV lithography line edge roughness and 16 nm NAND memory performance
Vaglio Pret, Alessandro; Poliakov, Pavel; Gronheid, Roel; Blomme, Pieter; Miranda Corbalan, Miguel; Dehaene, Wim; Verkest, Diederik; Van Houdt, Jan; Bianchi, Davide (2012) -
Low voltage low cost nitride embedded flash memory cell
Xue, Gang; Van Houdt, Jan; Wellekens, Dirk; Haspeslagh, Luc; Hendrickx, Paul; De Vos, Joeri; Maes, Herman (2003) -
Low-frequency noise assessment of ferro-electric field-effect transistors with Si-doped HfO2 gate dielectric
Simoen, Eddy; O'Sullivan, Barry; Ronchi, Nicolo; Van den Bosch, Geert; Linten, Dimitri; Van Houdt, Jan (2021) -
Material selection for hybrid floating gate in NAND memory applications
Lisoni, Judit; Breuil, Laurent; Blomme, Pieter; Meersschaut, Johan; Bergmaier, A; Dollinger, G; Van den Bosch, Geert; Van Houdt, Jan (2016) -
Measurement and statistical analysis of single trap current-voltage characteristics in ultrathin SiON
Degraeve, Robin; Govoreanu, Bogdan; Kaczer, Ben; Van Houdt, Jan; Groeseneken, Guido (2005-04) -
Memory technologies for the terabit era: a paradigm shift
Van Houdt, Jan (2014) -
Memory technology for the terabit era: from 2D to 3D
Van Houdt, Jan (2017) -
Memory technology: evolutionary versus revolutionary concepts
Van Houdt, Jan (2009) -
Metal gates and high-k interpoly dielectrics for hybrid floating gate memory applications
Lisoni, Judit; Cacciato, Antonio; Schram, Tom; Breuil, Laurent; Blomme, Pieter; Van Houdt, Jan (2012) -
Method for endurance optimization of the HIMOStm flash memory cell in a 90nm CMOS technology
Yao, T.; Lowe, A.; Vermeulen, T.; Bellafiore, N.; Van Houdt, Jan; Wellekens, Dirk (2005) -
Modeling of alternative high-k dielectrics for memory based applications
Pourtois, Geoffrey; Clima, Sergiu; Sankaran, Kiroubanand; Delugas, Pietro; Fiorentini, Vincenzo; Magnus, Wim; Soree, Bart; Van Elshocht, Sven; Van Houdt, Jan; Wouters, Dirk; De Gendt, Stefan; Heyns, Marc; Kittl, Jorge (2009) -
Modeling of alternative high-k dielectrics for memory based applications
Pourtois, Geoffrey; Clima, Sergiu; Sankaran, Kiroubanand; Delugas, Pietro; Fiorentini, Vincenzo; Magnus, Wim; Soree, Bart; Van Elshocht, Sven; Adelmann, Christoph; Van Houdt, Jan; Wouters, Dirk; De Gendt, Stefan; Heyns, Marc; Kittl, Jorge (2009) -
Modeling of uniform switching RRAM devices and impact of critical defects
Subhechha, Subhali; Degraeve, Robin; Roussel, Philippe; Goux, Ludovic; Clima, Sergiu; De Meyer, Kristin; Van Houdt, Jan; Kar, Gouri Sankar (2017) -
Modeling the inversion electron tunneling currents through ultrathin oxides/gate stacks
Govoreanu, Bogdan; Blomme, Pieter; Henson, Kirklen; Van Houdt, Jan; De Meyer, Kristin (2003) -
Modelling of the hole-initiated impact ionization current in the framework of hydrodynamic equations
Lorenzini, Martino; Van Houdt, Jan (2002)