Browsing by author "Dobrovolny, Petr"
Now showing items 1-20 of 41
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A holistic approach for statistical analysis of SRAM
Zuber, Paul; Dobrovolny, Petr; Miranda Corbalan, Miguel (2010) -
A methodology for efficient high-level dataflow simulation of mixed-signal front-ends of digital telecom tranceivers
Vandersteen, Gerd; Wambacq, Piet; Rolain, Yves; Dobrovolny, Petr; Donnay, Stephane; Engels, Marc; Bolsens, Ivo (2000) -
Analysis and compact behavioral modeling of nonlinear distortion in analog communication circuits
Dobrovolny, Petr; Vandersteen, Gerd; Wambacq, Piet; Donnay, Stephane (2003) -
Analysis and white-box modeling of weakly nonlinear time-varying circuits
Dobrovolny, Petr; Vandersteen, Gerd; Wambacq, Piet; Donnay, Stephane (2003) -
Atomistic approach to variability of bias-temperature instability in circuit simulations
Kaczer, Ben; Mahato, Swaraj; Valduga de Almeida Camargo, Vinicius; Toledano Luque, Maria; Roussel, Philippe; Grasser, Tibor; Catthoor, Francky; Dobrovolny, Petr; Zuber, Paul; Wirth, Gilson; Groeseneken, Guido (2011-04) -
Compact modeling of nonlinear distortion in analog communication circuits
Wambacq, Piet; Dobrovolny, Petr; Donnay, Stephane; Engels, Marc; Bolsens, Ivo (2000) -
Dataflow simulation of mixed-signal communication circuits using a local multirate, multicarrier signal representation
Wambacq, Piet; Vandersteen, Gerd; Rolain, Yves; Dobrovolny, Petr; Goffioul, Michael; Donnay, Stephane (2002) -
Device to product level assessment of process variability
Miranda Corbalan, Miguel; Dobrovolny, Petr; Zuber, Paul; Roussel, Philippe (2011) -
Generation of multicarrier complex lowpass models of RF ICs
Dobrovolny, Petr; Wambacq, P.; Vandersteen, Gerd; Donnay, Stephane; Engels, Marc; Bolsens, Ivo (2001) -
High-level simulation and modeling tools for mixed-signal front-ends of wireless systems
Wambacq, Piet; Vandersteen, Gerd; Dobrovolny, Petr; Goffioul, Michael; Eberle, Wolfgang; Badaroglu, Mustafa; Donnay, Stephane (2002) -
High-level simulation of substrate noise in high-ohmic substrates with interconnect and supply effects
Van der Plas, Geert; Badaroglu, Mustafa; Vandersteen, Gerd; Dobrovolny, Petr; Wambacq, Piet; Donnay, Stephane; Gielen, Georges; De Man, Hugo (2004) -
Impact of Fin height variations on SRAM yield
Dobrovolny, Petr; Zuber, Paul; Miranda Corbalan, Miguel; Garcia Bardon, Marie; Chiarella, Thomas; Buchegger, Peter; Mercha, Abdelkarim; Verkest, Diederik; Steegen, An; Horiguchi, Naoto (2012-04) -
Impact of line edge roughness on cell-to-cell coupling variability in NAND flash arrays
Poliakov, Pavel; Blomme, Pieter; Miranda Corbalan, Miguel; Anchlia, Ankur; Dobrovolny, Petr; Brusamarello, Lucas; Stucchi, Michele; Van Houdt, Jan; Dehaene, Wim (2010-03) -
Impact of process variability on the radiation-induced soft error rate of decananometer SRAMs in hold and read conditions
Griffoni, Alessio; Zuber, Paul; Dobrovolny, Petr; Roussel, Philippe; Linten, Dimitri; Alles, Michael L.; Schrimpf, Ronald D.; Reed, Robert A.; Kobayashi, Daisuke; Simoen, Eddy; Groeseneken, Guido (2011) -
Logic scaling assessment in 20nm and beyond under electrical and litho constraints
Badaroglu, Mustafa; Garcia Bardon, Marie; Dobrovolny, Petr; Zuber, Paul; Miranda Corbalan, Miguel (2012) -
Memory wide statistical analysis for robust SRAM design – Part I: what and why
Zuber, Paul; Dobrovolny, Petr; Miranda Corbalan, Miguel (2010) -
New tools and methods in robust SRAM design
Zuber, Paul; Miranda Corbalan, Miguel; Dobrovolny, Petr (2011) -
Opportunities for system level technology assessment
Zuber, Paul; Dobrovolny, Petr; Christie, Phillip (2013) -
Propagating variability from technology to system level
Dierickx, Bart; Miranda Corbalan, Miguel; Dobrovolny, Petr; Kutscherauer, Florian; Papanikolaou, Antonis; Marchal, Pol (2007) -
Scaling friendly design methodology for inductively-degenerated common-source low noise amplifiers
Vandersteen, Gerd; Bos, Lynn; Dobrovolny, Petr (2007)