Browsing by author "Afanas'ev, V."
Now showing items 1-7 of 7
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Atomic Hydrogen Exposure to Enable High-Quality Low-Temperature SiO2 with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier Stacking
Franco, Jacopo; de Marneffe, Jean-Francois; Vandooren, Anne; Kimura, Yosuke; Nyns, Laura; Wu, Zhicheng; El-Sayed, A-M; Jech, M.; Waldhoer, D.; Claes, Dieter; Arimura, Hiroaki; Ragnarsson, Lars-Ake; Afanas'ev, V.; Stesmans, A.; Horiguchi, Naoto; Linten, Dimitri; Grasser, T.; Kaczer, Ben (2020) -
Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy
Wu, Zhicheng; Vaisman Chasin, Adrian; Franco, Jacopo; Subhechha, Subhali; Dekkers, Harold; Yengula Venkata Ramana, Bhuvaneshwari; Belmonte, Attilio; Rassoul, Nouredine; van Setten, Michiel; Afanas'ev, V.; Delhougne, Romain; Kaczer, Ben; Kar, Gouri Sankar (2022) -
Ge deep sub-micron pFETs with etched TaN metal gate on a High-K dielectric, fabricated in a 200mm silicon prototyping line
De Jaeger, Brice; Houssa, Michel; Satta, Alessandra; Kubicek, Stefan; Verheyen, Peter; Van Steenbergen, Jan; Croon, Jeroen; Kaczer, Ben; Van Elshocht, Sven; Delabie, Annelies; Kunnen, Eddy; Sleeckx, Erik; Teerlinck, Ivo; Lindsay, Richard; Schram, Tom; Chiarella, Thomas; Degraeve, Robin; Conard, Thierry; Poortmans, Jef; Winderickx, Gillis; Boullart, Werner; Schaekers, Marc; Mertens, Paul; Caymax, Matty; Vandervorst, Wilfried; Van Moorhem, Els; Biesemans, Serge; De Meyer, Kristin; Ragnarsson, Lars-Ake; Lee, S.; Kota, G.; Raskin, G.; Mijlemans, P.; Autran, J.L.; Afanas'ev, V.; Stesmans, A.; Meuris, Marc; Heyns, Marc (2004) -
Measurement of direct and indirect bandgaps in synthetic ultrathin MoS2 and WS2 films from photoconductivity spectra
Shlyakhov, Ilya; Iakoubovskii, K.; Banerjee, Sreetama; Gaur, Abhinav; Lin, Dennis; Asselberghs, Inge; Radu, Iuliana; Chai, J.; Yang, M.; Wang, S. J.; Houssa, Michel; Stesmans, A.; Afanas'ev, V. (2021) -
Metal gate work function extraction using Fowler-Nordheim tunneling techniques
Sjöblom, G.; Pantisano, Luigi; Schram, Tom; Olsson, J.; Afanas'ev, V.; Heyns, Marc (2005) -
Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability
Afanas'ev, V.; Ravsher, Taras; Houshmand Sharifi, Shamin; Fantini, Andrea; Hody, Hubert; Witters, Thomas; Garbin, Daniele; Degraeve, Robin; Van Houdt, Jan; Goux, Ludovic; Crotti, Davide; Kar, Gouri Sankar (2021) -
Trap-assisted tunneling in high permittivity gate dielectric stacks
Houssa, Michel; Tuominen, Marko; Naili, Mohamed; Afanas'ev, V.; Stesmans, Andre; Haukka, S.; Heyns, Marc (2000)