Browsing by author "Zorian, Yervant"

Guest editorial: Special issue on testing of 3D stacked integrated circuits

Marinissen, Erik Jan; Zorian, Yervant (2012-02)

Guest editors introduction: the status of IEEE Std 1500 - Part 2

Marinissen, Erik Jan; Zorian, Yervant (2009)

Guest editors' introduction: Design & test of a high-volume 3D-stacked graphics processor with high-bandwidth memory

Marinissen, Erik Jan; Zorian, Yervant (2017-01)

Guest editors' introduction: The status of IEEE Std 1500

Marinissen, Erik Jan; Zorian, Yervant (2009)

IEEE 1500 enables modular SOC testing

Marinissen, Erik Jan; Zorian, Yervant (2009)

IoT: Source of test challenges

Marinissen, Erik Jan; Zorian, Yervant; Konijnenburg, Mario; Huang, Chih-Tsun; Hsieh, Ping-Hsuan; Cockburn, Peter; Delvaux, Jeroen; Rozic, Vladimir; Yang, Bohan; Singelee, Dave; Verbauwhede, Ingrid; Mayor, Cedric; van Rijsinge, Robert; Reyes, Cocoy (2016-05)

Testing 3D chips containing through-silicon vias

Marinissen, Erik Jan; Zorian, Yervant (2009)