Browsing by author "Kosemura, Daisuke"
Now showing items 1-8 of 8
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Comparison of NBTI aging on adder architectures and ring oscillators in the downscaled technologies
Kosemura, Daisuke; Weckx, Pieter; Morrison, Sebastien; Franco, Jacopo; Toledano Luque, Maria; Cho, Moon Ju; Raghavan, Praveen; Kaczer, Ben; Jang, Doyoung; Miyaguchi, Kenichi; Garcia Bardon, Marie; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2015) -
Correlation between temperature dependence of Raman shifts and in-plane strains in an AlGaN/GaN stack
Kosemura, Daisuke; Sodan, Vice; De Wolf, Ingrid (2017) -
Edge trimming for wafer-to-wafer 3D integration
Inoue, Fumihiro; Visker, Jakob; Jourdain, Anne; Moeller, Berthold; Yokoyama, Kaori; Peng, Lan; Kosemura, Daisuke; De Wolf, Ingrid; Rebibis, Kenneth June; Miller, Andy; Beyne, Eric; Sleeckx, Erik (2016) -
Edge trimming induced defects on direct bonded wafers
Inoue, Fumihiro; Jourdain, Anne; Peng, Lan; Phommahaxay, Alain; Kosemura, Daisuke; De Wolf, Ingrid; Rebibis, Kenneth June; Miller, Andy; Sleeckx, Erik; Beyne, Eric (2018) -
Edge-enhanced Raman scattering in narrow sGe fin field-effect transistor channels
Nuytten, Thomas; Hantschel, Thomas; Kosemura, Daisuke; Schulze, Andreas; De Wolf, Ingrid; Vandervorst, Wilfried (2015) -
Experimental benchmarking of electrical methods and $l-Raman spectroscopy for channel temperature detection in AlGaN/GaN HEMTs
Sodan, Vice; Kosemura, Daisuke; Stoffels, Steve; Oprins, Herman; Baelmans, Martine; Decoutere, Stefaan; De Wolf, Ingrid (2016) -
Stress measurements in semiconductor devices using nano-focused Raman spectroscopy
Nuytten, Thomas; Kosemura, Daisuke; Bogdanowicz, Janusz; Witters, Liesbeth; Eneman, Geert; Hantschel, Thomas; Schulze, Andreas; Favia, Paola; Bender, Hugo; De Wolf, Ingrid; Vandervorst, Wilfried (2016) -
Three-dimensional micro-Raman spectroscopy mapping of stress induced in Si by Cu-filled through-Si vias
Kosemura, Daisuke; De Wolf, Ingrid (2015)