Browsing by author "Chang, M.H."
Now showing items 1-7 of 7
-
Damaging species in the hole injection induced electron trap generation
Chang, M.H.; Zhang, J.F.; Groeseneken, Guido; Degraeve, Robin (2003) -
Dominant layer for stress-induced positive charges in Hf-based gate stacks
Zhang, Jian F.; Chang, M.H.; Ji, Z.; Lin, L.; Ferain, Isabelle; Groeseneken, Guido; Pantisano, Luigi; De Gendt, Stefan; Heyns, Marc (2008) -
Effects of measurement temperature on NBTI
Zhang, J.F.; Chang, M.H.; Groeseneken, Guido (2007-04) -
Impact of different defects on the kinetics of Negative Bias Temperature Instability of Hafnium stacks
Zhang, J.F.; Zhao, C.Z.; Chang, M.H.; Zahid, Mohammed; Peaker, A.R.; Hall, S; Groeseneken, Guido; Pantisano, Luigi; De Gendt, Stefan; Heyns, Marc (2008) -
Instability and defects in gate dielectric: similarity and differences between Hf-stacks and SiO2
Zhang, J.F.; Zhao, C.Z.; Chang, M.H.; Zhang, W.; Groeseneken, Guido; Pantisano, Luigi; De Gendt, Stefan; Heyns, Marc (2007) -
On the activation and passivation of precursors for process-induced positive charges in Hf-dielectric stacks
Chang, M.H.; Zhao, C.Z.; Ji, Z.; Zhang, J.F.; Groeseneken, Guido; Pantisano, Luigi; De Gendt, Stefan; Heyns, Marc (2009) -
Process-induced positive charges in Hf-based gate stacks
Zhao, C.Z.; Zhang, J.F.; Chang, M.H.; Peaker, A.R.; Hall, S.; Groeseneken, Guido; Pantisano, Luigi; De Gendt, Stefan; Heyns, Marc (2008)