Browsing by author "Krishnasamy, Rajendran"
Now showing items 1-17 of 17
-
A novel model for boron diffusion in SiGe strained layers based on a kinetic driven Ge-B pairing mechanism
Villaneuva, D.; Moens, P.; Krishnasamy, Rajendran; Schoenmaker, Wim (2001) -
A simple model and simulation of complete suppression of boron out-diffusion in Si1-xGex by carbon insertion
Krishnasamy, Rajendran; Schoenmaker, Wim (2001) -
A simple modelling of device speed in double-gate SOI MOSFETs
Krishnasamy, Rajendran; Samudra, G. (2000) -
Comparative analysis of minimum surface potential and location of barrier peaks in various Si MOSFET devices
Samudra, G.; Krishnasamy, Rajendran (2000) -
Measurement and simulation of boron diffusion in strained Si1- xGex epitaxial layers
Krishnasamy, Rajendran; Schoenmaker, Wim; Decoutere, Stefaan; Loo, Roger; Caymax, Matty; Vandervorst, Wilfried (2001) -
Measurement and simulation of boron diffusion in strained Si1- xGex epitaxial layers with a linearly graded germanium profile
Krishnasamy, Rajendran; Schoenmaker, Wim (2001) -
Measurement and simulation of boron diffusion in strained Si1-xGex epitaxial layers with linearly graded germanium profile
Krishnasamy, Rajendran; Schoenmaker, Wim (2000) -
Measurement and simulation of boron diffusivity in strained Si1-xGex epitaxial layers
Krishnasamy, Rajendran; Schoenmaker, Wim (2000) -
Measurement and simulation of boron diffusivity in strained Si1-XGex epitaxial layers
Krishnasamy, Rajendran; Schoenmaker, Wim (2001) -
Modeling and simulation of nonlinear electron-hole plasma in deep submicron n-MOSFET devices
Krishnasamy, Rajendran; Ganesh, S. S. (1999) -
Modeling of clustering reaction and diffusion of boron in strained Si1-xGex epitaxial layers
Krishnasamy, Rajendran; Villaneuva, D.; Moens, P.; Schoenmaker, Wim (2003) -
Modeling of complete suppression of boron out-diffusion in Si1-xGex by carbon incorporation
Krishnasamy, Rajendran; Schoenmaker, Wim (2001) -
Modeling of minimum surface potential and sub-threshold swing for grooved-gate MOSFETs
Krishnasamy, Rajendran; Schoenmaker, Wim (2001) -
Modelling and computer simulation study of laser-plasma interaction in semiconductor
Krishnasamy, Rajendran (1999) -
Modelling of transconductance-to-current ratio (g(m)ID) analysis on double-gate SOI MOSFETs
Krishnasamy, Rajendran; Samudra, G. S. (2000) -
Simulation of boron diffusion in strained Si1-xGex epitaxial layers
Krishnasamy, Rajendran; Schoenmaker, Wim; Decoutere, Stefaan; Caymax, Matty (2000) -
Studies of boron diffusion in strained Si1-xGex epitaxial layers
Krishnasamy, Rajendran; Schoenmaker, Wim (2001)