Browsing by author "Arora, R."
Now showing items 1-3 of 3
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Interface and border traps in Ge pMOSFETs
Fleetwood, Daniel; Simoen, Eddy; Francis, Sarah; Zhang, C.X.; Arora, R.; Zhang, E.X.; Schrimpf, Ronald; Galloway, Ken; Mitard, Jerome; Claeys, Cor (2012) -
Radiation hardness of SiGe and Ge-based CMOS technologies
Claeys, Cor; Iacvo, C.; Mitard, Jerome; Arora, R.; Zhang, C.; Galloway, K.; Fleetwood, D.; Schrimpf, R.; Poizat, M.; Simoen, Eddy (2011) -
Total ionizing dose effects on Ge pMOSFETs with high-k gate stack: on/off current ratio
Kulkarni, S.R.; Schrimpf, R.D.; Galloway, K.F.; Arora, R.; Claeys, Cor; Simoen, Eddy (2009)