Browsing by author "Agbo, Innocent"
Now showing items 1-19 of 19
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Bias temperature instability analysis of FinFET based SRAM cells
Khan, Seyab; Agbo, Innocent; Hamdioui, Said; Kukner, Halil; Kaczer, Ben; Raghavan, Praveen; Catthoor, Francky (2014) -
BTI analysis for high performance and low power SRAM sense amplifier designs
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2015) -
Comparative analysis of RD and atomistic trap-based BTI models on SRAM sense amplifier
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Cosemans, Stefan; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2015) -
Comparative BTI analysis for various sense amplifier designs
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Raghavan, Praveen; Catthoor, Francky (2016) -
Comparative BTI impact for SRAM cell and sense amplifier designs
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Raghavan, Praveen; Catthoor, Francky; Dehaene, Wim (2015) -
Degradation analysis of high performance 14nm FinFET SRAM
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2018) -
Estimation of sense amplifier offset voltage degradation due to zero- and run-time variability
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2017) -
Hardware-based aging mitigation scheme for memory address decoder
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2019) -
Impact and mitigation of sense amplifier aging degradation using realistic workloads
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2017) -
Impact and mitigation of SRAM read path aging
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky; Dehaene, Wim (2018) -
Integral impact of BTI and voltage temperature variation on SRAM sense amplifier
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Kukner, H.; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2015) -
Integral Impact of BTI, PVT-variation and Workload on SRAM Sense Amplifier
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2017) -
Methodology for application-dependent degradation analysis of memory timing
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2019) -
Mitigation of sense amplifier degradation using input switching
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky; Dehaene, Wim (2017) -
Parametric and functional degradation analysis of complete 14-nm FinFET SRAM
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2019) -
Quantification of sense amplifier offset voltage degradation due to zero-and run-time variability
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Raghavan, Praveen; Catthoor, Francky; Dehaene, Wim (2016) -
Read path degradation analysis in SRAM
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky; Dehaene, Wim (2016) -
Sense amplifier offset voltage analysis for both time-zero and time-dependent variability
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Raghavan, Praveen; Catthoor, Francky; Dehaene, Wim (2019) -
Sense amplifier offset voltage mitigation under presence of BTI
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky; Dehaene, Wim (2017)