Browsing by author "McNally, P. J."
Now showing items 1-6 of 6
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Epitaxial laterial overgrowth of GaN on sapphire. An examination of epitaxy quality using synchrotron X-ray topography
McNally, P. J.; Tuomi, T.; Lowney, D.; Jacobs, Koen; Danilewsky, A. N.; Rantamaki, R.; O'Hare, M.; Considine, L. (2001) -
Evaluation of stress reduction in shallow trench isolation CMOS structures via synchrotron X-ray topography, Raman spectroscopy and electrical data
McNally, P. J.; Curley, J. W.; Bolt, M.; Reader, A.; De Wolf, Ingrid; Tuomi, T.; Rantamäki, R.; Danilewski, A. N. (1998) -
Micro-Raman spectroscopy evaluation of the local mechanical stress in shallow trench isolation CMOS structures: correlation with defect generation and diode leakage
De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman; Bolt, M.; Barla, K.; Reader, A.; McNally, P. J. (1998) -
Monitoring of stress reduction in shallow trench isolation CMOS structures via synchrotron x-ray topography, electrical data and Raman spectroscopy
McNally, P. J.; Curley, J. W.; Bolt, M.; Reader, A.; Tuomi, T.; Rantamaki, R.; Danilewsky, A. N.; De Wolf, Ingrid (1999) -
Synchrotron x-ray topography studies of epitaxial laterial overgrowth of GaN on sapphire
McNally, P. J.; O'Hare, M.; Tuomi, T.; Rantamaki, R.; Jacobs, Koen; Considine, L.; Danilewsky, A. N. (1999) -
White beam synchroton x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN
Chen, W. M.; McNally, P. J.; Jacobs, Koen; Tuomi, T.; Danilewsky, A. N.; Lowney, D.; Kanatharana, J.; Knuuttila, L.; Riikonen, J. (2001)