Browsing by author "Henson, W. K."
Now showing items 1-4 of 4
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A comparative study of gate direct tunneling and drain leakage currents in N-MOSFET's with sub-2-nm gate oxides
Yang, N.; Henson, W. K.; Wortman, J. J. (2000) -
Analysis of tunneling currents and reliability of NMOSFET's with sub-2 nm gate oxides
Yang, N.; Henson, W. K.; Wortman, J. J. (1999) -
Investigation of instrinsic transistor performance of advanced CMOS devices with 2.5 nm NO gate oxides
Kubicek, Stefan; Henson, W. K.; De Keersgieter, An; Badenes, Gonçal; Jansen, Philippe; van Meer, Hans; Kerr, Daniel; Naem, Abdalla; Deferm, Ludo; De Meyer, Kristin (1999) -
Observation of oxide breakdown and its effects on the characteristics of ultra-thin-oxide nMOSFETs
Henson, W. K.; Yang, N.; Wortman, J. J. (1999)