Browsing by author "Altmann, Frank"
Now showing items 1-8 of 8
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3D Localization of liner breakdown within Cu filled TSV?s by backside LIT and PEM defocusing series
Altmann, Frank; Grosse, Christian; De Wolf, Ingrid; Brand, Sebastian (2017) -
Acoustic and photoacoustic inspection of through-silicon-vias in the GHz-frequency band
Brand, Sebastian; Kogel, Michael; Altmann, Frank; De Wolf, Ingrid; Khaled, Ahmad; Moore, Michael J.; Strohm, Eric M.; Kolios, Michael C.; Strohm, Eric. M. (2017) -
Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization
Mukherjee, Kalparupa; De Santi, Carlo; Borga, Matteo; Geens, Karen; You, Shuzhen; Bakeroot, Benoit; Decoutere, Stefaan; Diehle, Patrick; Huebner, Susanne; Altmann, Frank; Buffolo, Matteo; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo (2021) -
Fast and distributed thermal model for thermal modeling of GaN power devices
Sodan, Vice; Stoffels, Steve; Oprins, Herman; Decoutere, Stefaan; Altmann, Frank; Baelmans, Martine; De Wolf, Ingrid (2018-10) -
New access to soft breakdown parameters of low k dielectrics through localization-based analysis
Herfurth, Norbert; Simon-Najasek, M.; Herfurth, R.; Hübner, S.; Altmann, Frank; Beyreuther, A.; Amini, E.; De Wolf, Ingrid; Wu, Chen; Croes, Kristof; Boit, Christian (2019) -
Non-invasive soft breakdown localisation in low k dielectrics using photon emission microscopy and thermal laser stimulation
Herfurth, Norbert; Wu, Chen; Beureuther, A.; Nakamura, T.; De Wolf, Ingrid; Simon-Najasek, M.; Altmann, Frank; Croes, Kristof; Boit, Christian (2019) -
Root cause analysis of gate shorts in semi-vertical GaN MOSFET devices
Diehle, Patrick; Hübner, Susanne; De Santi, Carlo; Mukherjee, Kalparupa; Zanoni, Enrico; Meneghini, Matteo; Geens, Karen; You, Shuzhen; Decoutere, Stefaan; Altmann, Frank (2021) -
Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR)
Koegel, Michael; Brand, Sebastian; Grosse, Christian; Jacobs, Kristof J.P.; De Wolf, Ingrid; Altmann, Frank (2021)