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Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR)
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Authors
Koegel, Michael
;
Brand, Sebastian
;
Grosse, Christian
;
Jacobs, Kristof J.P.
;
De Wolf, Ingrid
;
Altmann, Frank
DOI
10.1109/CASE49439.2021.9551575
EISBN
978-1-6654-1873-7
ISSN
2161-8070
Conference
17th IEEE International Conference on Automation Science and Engineering (CASE)
Journal
na
Title
Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR)
Publication type
Proceedings paper
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2
20.500.12860/42063.2
*
2023-08-08T10:07:19Z
validation by library/open access desk
1
20.500.12860/42063
2023-06-20T10:39:43Z
*Selected version
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