Browsing by author "Ker, Ming-Dou"
Now showing items 1-7 of 7
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ESD Failures of GaN-on-Si D-Mode AlGaN/GaN MIS-HEMT and HEMT Devices for 5G Telecommunications
Wu, Wei-Min; Chen, Shih-Hung; Putcha, Vamsi; Peralagu, Uthayasankaran; Sibaja-Hernandez, Arturo; Yadav, Sachin; Parvais, Bertrand; Alian, AliReza; Collaert, Nadine; Ker, Ming-Dou; Groeseneken, Guido (2021) -
ESD HBM Discharge Model in RF GaN-on-Si (MIS)HEMTs
Wu, Wei-Min; Ker, Ming-Dou; Chen, Shih-Hung; Sibaja-Hernandez, Arturo; Yadav, Sachin; Peralagu, Uthayasankaran; Yu, Hao; Alian, AliReza; Putcha, Vamsi; Parvais, Bertrand; Collaert, Nadine; Groeseneken, Guido (2022-01-25) -
Interconnect Capacitance Investigation and Optimization Under I/O Pad for ESD Protection of RF/High Speed Circuits in Micro- & Nano-scale CMOS Technology
Wu, Wei-Min; Chen, Jie-Ting; Chen, Shih-Hung; Ker, Ming-Dou; Linten, Dimitri; Groeseneken, Guido (2020) -
Latchup in bulk finFET technology
Dai, Chia Tsen; Chen, Shih-Hung; Linten, Dimitri; Scholz, Mirko; Hellings, Geert; Boschke, Roman; Karp, J.; Hart, M.; Groeseneken, Guido; Ker, Ming-Dou; Mocuta, Anda; Horiguchi, Naoto (2017) -
Local CDM ESD protection circuits for cross-power domains in 3D IC applications
Chen, Shih-Hung; Linten, Dimitri; Scholz, Mirko; Huang, Yu-Ching; Hellings, Geert; Boschke, Roman; Ker, Ming-Dou; Groeseneken, Guido (2014-06) -
ON-State Human Body Model ESD Failure Mechanisms in GaN-on-Si RF MIS-HEMTs
Wu, Wei-Min; Chen, Shih-Hung; Shih, Chun-An; Parvais, Bertrand; Collaert, Nadine; Ker, Ming-Dou; Wu, Tian-Li; Groeseneken, Guido (2023) -
RF/high-speed I/O ESD protection: Co-optimizing strategy between BEOL capacitance and HBM immunity in advanced CMOS process
Wu, Wei-Min; Ker, Ming-Dou; Chen, Shih-Hung; Chen, Jie-Ting; Linten, Dimitri; Groeseneken, Guido (2020)