Browsing by author "Khan, Seyab"
Now showing items 1-8 of 8
-
Bias temperature instability analysis in SRAM decoder
Khan, Seyab; Hamdioui, Said; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky (2013) -
Bias temperature instability analysis of FinFET based SRAM cells
Khan, Seyab; Agbo, Innocent; Hamdioui, Said; Kukner, Halil; Kaczer, Ben; Raghavan, Praveen; Catthoor, Francky (2014) -
BTI analysis, monitoring and mitigation for nano scaled circuits
Khan, Seyab (2013) -
BTI impact on logical gates in nano-scale CMOS technology
Kukner, Halil; Khan, Seyab; Hamdioui, Said; Raghavan, Praveen; Catthoor, Francky (2012) -
Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates
Kukner, Halil; Khan, Seyab; Weckx, Pieter; Raghavan, Praveen; Hamdioui, Said; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2014) -
Impact of partial resistive defects and bias temperature instability on SRAM decoder reliability
Khan, Seyab; Taouil, Mottaqiallah; Hamdioui, Said; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky (2013) -
Incorporating parameter variations in BTI impact on nano-scale logical gate analysis
Khan, Seyab; Hamdioui, Said; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky (2012) -
NBTI monitoring and design for reliability in nanoscale circuits
Khan, Seyab; Haron, Nor Zaidi; Hamdioui, Said; Catthoor, Francky (2011)