Browsing by author "Van Meirhaeghe, R."
Now showing items 1-6 of 6
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A ballistic electron-emission microscopy (BEEM)-investigation of the effects of chemical pretreatments on III-V semiconductor Schottky barriers
Van Meirhaeghe, R.; Vanalme, G.; Goubert, L.; Cardon, F.; Van Daele, P. (1998) -
CoSi2 formation using a Ti capping layer - influence of processing conditions on CoSi2 nucleation
Detavernier, C.; Van Meirhaeghe, R.; Maex, Karen (2001) -
Electrical transport in (100)CoSi2/Si contacts
Lauwers, A.; Kyllesbech Larsen, K.; Van Hove, Marleen; Verbeeck, Rita; Maex, Karen; Van Rossum, Marc; Vercaemst, A.; Van Meirhaeghe, R.; Cardon, F. (1995) -
The influence of Ti capping layers on CoSi2 formation
Detavernier, C.; Donaton, R.; Maex, Karen; Van Meirhaeghe, R.; Cardon, F. (1999) -
The influence of Ti capping layers on CoSi2 formation in the presence of interfacial oxide
Detavernier, C.; Alves Donaton, Ricardo; Maex, Karen; Jin, S.; Bender, Hugo; Van Meirhaeghe, R.; Cardon, F. (1999) -
The influence of TiN on the thermal stability of CoSi2
Detavernier, C.; Ruttens, Gerlinde; Van Meirhaeghe, R.; Maex, Karen (2001)