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A ballistic electron-emission microscopy (BEEM)-investigation of the effects of chemical pretreatments on III-V semiconductor Schottky barriers
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1996 since deposited on 2021-10-01
1last month
Acq. date: 2026-02-28
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Statistics
Views
1996 since deposited on 2021-10-01
1last month
Acq. date: 2026-02-28
Citations