Browsing by author "Wang, P."
Now showing items 1-3 of 3
-
CVD Mn-based self-formed barrier for advanced interconnect technology
Siew, Yong Kong; Jourdan, Nicolas; Barbarin, Yohan; Machillot, Jerome; Demuynck, Steven; Croes, Kristof; Tseng, J.; Ai, Hua; Tang, Jing; Naik, M.; Wang, P.; Narasimhan, M.; Abraham, M.; Cockburn, Andrew; Boemmels, Juergen; Tokei, Zsolt (2013) -
Total-ionizing-dose effects and low-frequency noise in 30-nm gate-length Bulk and SOI FinFETs with SiO2/HfO2 gate delectrics
Gorchichko, M.; Cao, Y.; Zhang, E.X.; Yan, D.; Gong, H.; Zhao, S.E.; Wang, P.; Jiang, R.; Liang, C.; Fleedwood, D.M.; Schrimpf, R.D.; Reed, R.A.; Linten, Dimitri (2020) -
Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors
Gorchichko, Maria; Zhang, E.X.; Wang, P.; Schrimpf, R.; Reed, R.; Fleetwood, D.M.; Bonaldo, S.; Linten, Dimitri; Mitard, Jerome (2020)