Browsing by author "Giangrandi, Simone"
Now showing items 1-16 of 16
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A comparison of spike, flash, SPER and laser annealing for 45nm CMOS
Lindsay, Richard; Pawlak, Bartek; Kittl, Jorge; Henson, Kirklen; Torregiani, Cristina; Giangrandi, Simone; Surdeanu, Radu; Vandervorst, Wilfried; Mayur, A.; Ross, J.; McCoy, S.; Gelpey, J.; Elliott, K.; Pagès, Xavier; Satta, Alessandra; Lauwers, Anne; Stolk, P.; Maex, Karen (2003) -
A theoretical and experimental study of atomic-layer-deposited films onto porous dielectric substrates
Travaly, Youssef; Schuhmacher, Jorg; Baklanov, Mikhaïl; Giangrandi, Simone; Richard, Olivier; Brijs, Bert; Van Hove, Marleen; Maex, Karen; Abell, Thomas; Somers, K.R.F; Hendrickx, M.F.A; Vanquickenborne, L.G.; Ceulemans, A.; Jonas, A.M (2005-10) -
Analysis of nanoparticles with elastic recoil detection
Arstila, Kai; Brijs, Bert; Giangrandi, Simone; Hantschel, Thomas; Vandervorst, Wilfried (2009) -
ARIBA: a combined analysis set-up for high resolution RBS and TOF-ERDA for thin film analysis
Sajavaara, Timo; Brijs, Bert; Giangrandi, Simone; Arstila, Kai; Vantomme, Andre; Vandervorst, Wilfried (2004) -
Characterization of high and low dielectrica using low Energy Time of Flight Elastic Recoil Detection
Brijs, Bert; Sajavaara, T.; Giangrandi, Simone; Arstila, K. (2005) -
Considerations about multiple and plural scattering in heavy-ion low-energy ERDA
Giangrandi, Simone; Arstila, Kai; Brijs, Bert; Sajavaara, T.; Vantomme, Andre; Vandervorst, Wilfried (2009) -
Depth resolution optimization and role of multiple scattering in low-energy TOF-ERDA
Giangrandi, Simone; Brijs, Bert; Arstila, Kai; Sajavaara, T.; Vantomme, Andre; Vandervorst, Wilfried (2007) -
Depth resolution optimization for low-energy ERDA
Giangrandi, Simone; Arstila, Kai; Brijs, Bert; Sajavaara, T.; Vantomme, Andre; Vandervorst, Wilfried (2007) -
Growth and characterization of atomic layer deposited WCxNy
Martin Hoyas, Ana; Travaly, Youssef; Schuhmacher, Jorg; Sajavaara, T.; Whelan, Caroline; Eyckens, Brenda; Richard, Olivier; Giangrandi, Simone; Brijs, Bert; Jonas, A.M.; Vantomme, A.; Vandervorst, Wilfried; Celis, Jean-Pierre; Maex, Karen (2005) -
Leakage optimatisation of ultra-shallow junctions formed by solid phase epitaxial regrowth (SPER)
Lindsay, Richard; Pawlak, Bartek; Kittl, Jorge; Henson, Kirklen; Giangrandi, Simone; Duffy, Ray; Surdeanu, Radu; Vandervorst, Wilfried; Pagès, Xavier; Van der Jeugd, Kees; Stolk, P.; Maex, Karen (2003) -
Leakage optimization of ultra-shallow junctions formed by solid phase epitaxial regrowth
Lindsay, Richard; Henson, Kirklen; Vandervorst, Wilfried; Maex, Karen; Pawlak, Bartek; Duffy, Ray; Surdeanu, Radu; Stolk, Peter; Kittl, Jorge; Giangrandi, Simone; Pagès, Xavier; Van der Jeugd, Kees (2004) -
Low-energy heavy-ion TOF-ERDA setup for quantitative depth profiling of thin films
Giangrandi, Simone; Sajavaara, Timo; Brijs, Bert; Arstila, Kai; Vantomme, Andre; Vandervorst, Wilfried (2008) -
Potentialities and limitations of low-energy TOF-ERDA for high resolution and quantitative profiling of thin films
Giangrandi, Simone; Brijs, Bert; Arstial, K.; Sajavaara, T.; Vantomme, Andre; Vandervorst, Wilfried (2007) -
Quantitative analysis of thin dielectrica with ultra high resolution ERD, MEIS and RBS
Vandervorst, Wilfried; Conard, Thierry; Giangrandi, Simone; Brijs, Bert; Bergmaier, A.; Kimura, K.; van den Berg, J.A.; Werner, M. (2007) -
The analysis of a thin SiO2/SixN1-x/SiO2 stack, a comparative study of low energy ERD with XPS, low energy SIMS, HRBS, HR-ERD
Brijs, Bert; Giangrandi, Simone; Arstila, K.; Bergmaier, A.; Kimura, K.; Conard, Thierry; Vandervorst, Wilfried; Vantomme, Andre (2005) -
Time-of-flight telescope for heavy-ion RBS
Giangrandi, Simone; Brijs, Bert; Sajavaara, T.; Arstila, Kai; Vantomme, Andre; Vandervorst, Wilfried (2007)