Browsing by author "Hughes, Greg"
Now showing items 1-8 of 8
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Charge trapping in MOSFETs with HfSiON dielectrics during electrical stressing
O'Connor, Robert; Hughes, Greg; Degraeve, Robin; Kaczer, Ben (2005) -
Low voltage stress-induced leakage current in 1.4 - 2.1 nm SiON and HfSiON gate dielectric layers
O'Connor, Robert; McDonnell, Stephen; Hughes, Greg; Degraeve, Robin; Kauerauf, Thomas (2005-08) -
On the use of (3-trimethoxysilylpropyl)diethylenetriamine self-assembled monolayers as seed layers for the growth of Mn based copper diffusion barrier layers
Bodgan, Justin; Brady-Boyd, Anita; O'Connor, Robert; Armini, Silvia; Selvaraju, Venkateswaran; Hughes, Greg (2018) -
Reliability of HfSiON gate dielectrics
O'Connor, Robert; Hughes, Greg; Degraeve, Robin; Kaczer, Ben; Kauerauf, Thomas (2005) -
Reliability of thin ZrO2 gate dielectric layers
O'Connor, Robert; Hughes, Greg; Kauerauf, Thomas; Ragnarsson, Lars-Ake (2011) -
Temperature-accelerated breakdown in ultra-thin SiON dielectrics
O'Connor, Robert; Hughes, Greg; Degraeve, Robin; Kaczer, Ben (2004) -
Time dependent dielectric breakdown and stress induced leakage current characteristics of 0.7nm EOT HfO2 pFETs
O'Connor, Robert; Hughes, Greg; Kauerauf, Thomas (2011) -
Time dependent dielectric breakdown and stress induced leakage current characteristics of 8 Å EOT HfO2 n-MOSFETs
O'Connor, Robert; Kauerauf, Thomas; Ragnarsson, Lars-Ake; Hughes, Greg (2010)