Publication:
Time dependent dielectric breakdown and stress induced leakage current characteristics of 8 Å EOT HfO2 n-MOSFETs
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Acq. date: 2026-01-09
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Acq. date: 2026-01-09
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1 since deposited on 2021-10-18
Acq. date: 2026-01-09
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1902 since deposited on 2021-10-18
1last month
Acq. date: 2026-01-09
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