Publication:
Time dependent dielectric breakdown and stress induced leakage current characteristics of 8 Å EOT HfO2 n-MOSFETs
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1 since deposited on 2021-10-18
Acq. date: 2025-12-11
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1901 since deposited on 2021-10-18
Acq. date: 2025-12-11
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1 since deposited on 2021-10-18
Acq. date: 2025-12-11
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1901 since deposited on 2021-10-18
Acq. date: 2025-12-11
Citations