Browsing by author "Stampfer, Bernhard"
Now showing items 1-4 of 4
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Extraction of statistical gate oxide parameters from large MOSFET arrrays
Stampfer, Bernhard; Simicic, Marko; Weckx, Pieter; Abbasi, Arash; Kaczer, Ben; Grasser, Tibor; Waltl, Michael (2020) -
Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology?
Waltl, Michael; Knobloch, Theresia; Tselios, Konstantinos; Filipovic, Lado; Stampfer, Bernhard; Hernandez, Yoanlys; Waldhor, Dominic; Illarionov, Yury; Kaczer, Ben; Grasser, Tibor (2022) -
Separation of electron and hole trapping components of PBTI in SiON nMOS transistors
Waltl, Michael; Stampfer, Bernhard; Rzepa, Gerhard; Kaczer, Ben; Grasser, Tibor (2020) -
Statistical characterization of BTI and RTN using pMOS arrays
Stampfer, Bernhard; Simicic, Marko; Weckx, Pieter; Abbasi, Arash; Kaczer, Ben; Grasser, Tibor; Waltl, Michael (2019)