Browsing by author "Jono, T."
Now showing items 1-8 of 8
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Effect of irradiation temperature on radiation damage in electron-irradiated MOS FETs
Ohyama, H.; Hayama, K.; Takakura, K.; Jono, T.; Simoen, Eddy; Claeys, Cor (2003) -
Influence of irradiation temperature on electron-irradiated STI Si diodes
Ohyama, Hidenori; Hayama, Kiyoteru; Takakura, K.; Miura, T.; Jono, T.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor (2002) -
Influence of irradiation temperature on electron-irradiated STI Si diodes
Ohyama, H.; Hayama, K.; Takakura, K.; Miura, T.; Shigaki, K.; Jono, T.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor (2003) -
Irradiation temperature dependence of radiation damage in STI Si diodes
Ohyama, H.; Hayama, K.; Takakura, K.; Miura,; Shigaki, K.; Jono, T.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor (2003) -
Radiation damage in Si photodiodes by high-temperature irradiation
Ohyama, H.; Simoen, Eddy; Claeys, Cor; Takakura, K.; Matsuoka, H.; Jono, T.; Uemura, J.; Kishikawa, T. (2003) -
Radiation damage induced in Si photodiodes by High-temerature neutron irradiation
Ohyama, H.; Takakura, K.; Matsuoka, H.; Jono, T.; Simoen, Eddy; Claeys, Cor; Uemura, J.; Kishikawa, T. (2003) -
Radiation damage induced in Si photodiodes by high-temperature neutron irradiation
Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Takakura, K.; Matsuoko, H.; Jono, T.; Uemura, J.; Kishikawa, T. (2002) -
Radiation source dependence on floating-body effect in thin gate oxide fully-depleted SOI N-MOSFETs
Hayama, K.; Ohyama, H.; Takakura, K.; Kuboyama, S.; Jono, T.; Oka, K.; Matsuda, S.; Simoen, Eddy; Claeys, Cor (2004)