Browsing by author "Capogreco, Elena"
Now showing items 41-48 of 48
-
Source/drain materials for Ge nMOS devices
Vohra, Anurag; Porret, Clément; Rosseel, Erik; Hikavyy, Andriy; Capogreco, Elena; Horiguchi, Naoto; Loo, Roger; Vandervorst, Wilfried (2019-10) -
Source/drain materials for Ge nMOS devices
Vohra, Anurag; Porret, Clément; Rosseel, Erik; Hikavyy, Andriy; Capogreco, Elena; Horiguchi, Naoto; Loo, Roger; Vandervorst, Wilfried (2019) -
TEM investigation of gate-all-around nanowire devices
Favia, Paola; Arimura, Hiroaki; Capogreco, Elena; Eneman, Geert; Mertens, Hans; Hikavyy, Andriy; Richard, Olivier; Witters, Liesbeth; Kundu, Paromita; Loo, Roger; Vancoille, Eric; Bender, Hugo (2019) -
TEM investigations of gate-all-around nanowire devices
Favia, Paola; Richard, Olivier; Eneman, Geert; Mertens, Hans; Arimura, Hiroaki; Capogreco, Elena; Hikavyy, Andriy; Witters, Liesbeth; Kundu, Paromita; Loo, Roger; Vancoille, Eric; Bender, Hugo (2019) -
Thermally stable, packaged aware LV HKMG platforms benchmark to enable low power I/O for next 3D NAND generations
Spessot, Alessio; Salahuddin, Shairfe Muhammad; Escobar Gavilanez, Ricardo; Ritzenthaler, Romain; Xiang, Yang; Budhwani, Rahul Kumar; Dentoni Litta, Eugenio; Capogreco, Elena; Bastos, Joao; Chen, Yangyin; Horiguchi, Naoto (2022) -
Toward high-performance and reliable Ge channel devices for 2 nm node and beyond
Arimura, Hiroaki; Capogreco, Elena; Vohra, Anurag; Porret, Clément; Loo, Roger; Rosseel, Erik; Hikavyy, Andriy; Cott, Daire; Boccardi, Guillaume; Witters, Liesbeth; Eneman, Geert; Mitard, Jerome; Collaert, Nadine; Horiguchi, Naoto (2020) -
Understanding and physical modeling superior hot-carrier reliability of Ge pNWFETs
Tyaginov, Stanislav; El-Sayed, Al-Moatasem; Makarov, Alexander; Vaisman Chasin, Adrian; Arimura, Hiroaki; Vandemaele, Michiel; Jech, Markus; Capogreco, Elena; Witters, Liesbeth; Grill, Alexander; De Keersgieter, An; Eneman, Geert; Linten, Dimitri; Kaczer, Ben (2019) -
Understanding the intrinsic reliability behavior of n-/p-Si and p-Ge nanowire FETs utilizing degradation maps
Vaisman Chasin, Adrian; Bury, Erik; Franco, Jacopo; Kaczer, Ben; Vandemaele, Michiel; Arimura, Hiroaki; Capogreco, Elena; Witters, Liesbeth; Ritzenthaler, Romain; Mertens, Hans; Horiguchi, Naoto; Linten, Dimitri (2018)