Publication:

Understanding the intrinsic reliability behavior of n-/p-Si and p-Ge nanowire FETs utilizing degradation maps

Date

2018
Proceedings Paper
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

39512.pdf 2.32 MB

Author(s)

Vaisman Chasin, Adrian  
;
Bury, Erik  
;
Franco, Jacopo  
;
Kaczer, Ben  
;
Vandemaele, Michiel  
;
Arimura, Hiroaki  
;
Capogreco, Elena  
;
Witters, Liesbeth  
;
Ritzenthaler, Romain  
;
Mertens, Hans  
;
Horiguchi, Naoto  
;
Linten, Dimitri  

Journal

Abstract

Description

Statistics

Downloads

2 since deposited on 2021-10-26
Acq. date: 2026-09-18

Views

1874 since deposited on 2021-10-26
1last month
Acq. date: 2026-09-18

Citations

Statistics

Downloads

2 since deposited on 2021-10-26
Acq. date: 2026-09-18

Views

1874 since deposited on 2021-10-26
1last month
Acq. date: 2026-09-18

Citations