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Understanding the intrinsic reliability behavior of n-/p-Si and p-Ge nanowire FETs utilizing degradation maps
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Acq. date: 2026-01-08
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Acq. date: 2026-01-08
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2 since deposited on 2021-10-26
Acq. date: 2026-01-08
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1870 since deposited on 2021-10-26
2last month
2last week
Acq. date: 2026-01-08
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