Publication:

Understanding the intrinsic reliability behavior of n-/p-Si and p-Ge nanowire FETs utilizing degradation maps

Date

2018
Proceedings Paper
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Author(s)

Vaisman Chasin, Adrian  
;
Bury, Erik  
;
Franco, Jacopo  
;
Kaczer, Ben  
;
Vandemaele, Michiel  
;
Arimura, Hiroaki  
;
Capogreco, Elena  
;
Witters, Liesbeth  
;
Ritzenthaler, Romain  
;
Mertens, Hans  
;
Horiguchi, Naoto  
;
Linten, Dimitri  

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