Browsing by author "Hamilton, B."
Now showing items 1-5 of 5
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Detection of localised variation in the electronic properties of GaN grown by MOCVD and MBE using scanning tunneling microscopy
Hamilton, B.; Ferhah, K.; Davidson, J.; Dawson, P.; Whittaker, E.; Cheng, T. S.; Foxon, C. T.; Bougrioua, Zahia; Thrush, E. J.; Harris, J. J.; Lee, K. J. (1999) -
Extrinsic stacking fault generation related to high-k dielectric growth on a Si substrate
Volkos, S.N.; Bernardini, S.; Rigopoulos, N.; Efthymiou, E.S.; Hawkins, I.D.; Hamilton, B.; Dobaczewski, L.; Hall, S.; Hurley, P.K; Delabie, Annelies; Peaker, A.R (2007) -
Interpretation of temperature-dependent transport properties of GaN/sapphire films grown by MBE and LP-MOCVD
Harris, J. J.; Lee, K. J.; Harrison, I.; Flannery, L. B.; Korakakis, D.; Cheng, T.; Foxon, C. T.; Bougrioua, Zahia; Moerman, Ingrid; Van der Stricht, Wim; Thrush, E. J.; Hamilton, B.; Ferhah, K. (1999) -
Interpretation of the temperature-dependent transport properties of GaN/Sapphire films grown by MBE and MOCVD
Harris, J. J.; Lee, K. J.; Harrison, I.; Flannery, L. B.; Korakakis, D.; Cheng, T. S.; Foxon, C. T.; Bougrioua, Zahia; Moerman, Ingrid; Van der Stricht, Wim; Thrush, E. J.; Hamilton, B.; Ferhah, K. (1999) -
Nanoscale imaging and x-ray spectroscopy of electrically active defects in ultra thin dielectrics on silicon
Bernardini, S.; Ishii, M.; Whittaker, E.; Hamilton, B.; Freeland, C.; Poolton, N.R.J.; De Gendt, Stefan (2007)