Authors

Hamilton, B.; Ferhah, K.; Davidson, J.; Dawson, P.; Whittaker, E.; Cheng, T. S.; Foxon, C. T.; Bougrioua, Zahia; Thrush, E. J.; Harris, J. J.; Lee, K. J.

Conference

3rd International Conference on Nitride Semiconductors - ICS3

Title

Detection of localised variation in the electronic properties of GaN grown by MOCVD and MBE using scanning tunneling microscopy

Publication type

Meeting abstract

Embargo date

9999-12-31