Browsing by author "Duan, Meng"
Now showing items 1-5 of 5
-
An investigation on border traps in III-V MOSFETs with an In0.53Ga0.47As channel
Ji, Zhigang; Zhang, Xiong; Franco, Jacopo; Gao, Rui; Duan, Meng; Zhang, Jian Fu; Zhang, Wei Dong; Kaczer, Ben; Alian, AliReza; Linten, Dimitri; Zhou, Daisy; Collaert, Nadine; De Gendt, Stefan; Groeseneken, Guido (2015) -
Insight into electron traps and their energy distribution under positive bias temperature stress and hot carrier aging
Duan, Meng; Zhang, Jian Fu; Ji, Zhigang; Zhang, Wei Dong; Vigar, David; Asen, Asenov; Gerrer, Louis; Chandra, Vikas; Aitken, Rob; Kaczer, Ben (2016) -
Key issues and solutions for characterizing hot carrier aging of nanometer scale nMOSFETs
Duan, Meng; Zhang, Jian Fu; Ji, Zhigang; Zhang, Wei Dong; Kaczer, Ben; Asenov, Asen (2017) -
New analysis method for time-dependent device-to-device variation accounting for within-device fluctuation
Duan, Meng; Zhang, Jian F.; Li, Zhigang; Zhang, Wei Dong; Kaczer, Ben; Schram, Tom; Ritzenthaler, Romain; Groeseneken, Guido; Asenov, Asen (2013) -
Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation
Gao, Rui; Manut, Azrif B.; Ji, Zhigang; Ma, Jigang; Duan, Meng; Zhang, Jian Fu; Franco, Jacopo; Hatta, Sharifah Wan Muhamad; Zhang, Wei Dong; Kaczer, Ben; Vigar, David; Linten, Dimitri; Groeseneken, Guido (2017)