Browsing by author "Iannacone, G."
Now showing items 1-3 of 3
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A model for MOS gate stack quality evaluation based on the gate current 1/f noise
Magnone, P.; Crupi, F.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008) -
Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
Crupi, F.; Giusi, G.; Iannacone, G.; Magnone, P.; Pace, C.; Simoen, Eddy; Claeys, Cor (2009) -
Modeling the gate current 1/f noise and its application to advanced CMOS devices
Crupi, F.; Magnone, P.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008)